NMS - Variable Pressure Field Emission Gun Scanning Electron Microscope with Analytical Detectors & Specimen Coater

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Value

£0

Classifications

Scanning electron microscopes

Tags

tender

Submission Deadline

2 years ago

Published

2 years ago

Description

This tender seeks to procure a Variable Pressure Field-Emission Gun Scanning Electron Microscope (VP FEG-SEM) and a range of analytical detectors (CL, EDX, WDS, EBDSD) and specimen coater (C/Pt) to enable high-resolution imaging and analysis which can be used in concert at the National Museums Collection Centre in Edinburgh to study a wide range of collections.

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Organisation

National Museums Scotland

Body governed by public law

Chante St Clair Inglis

[email protected]

+44 3001236789

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